X-ray diffraction on Pinus wood samples

• DOI: 10.22533/at.ed.02719030912

• Palavras-chave: Atena

• Keywords: Characterization; Pinus; Wood; XRD.

• Abstract:

  Pinus wood is widely used on

  several segments of the civil construction

  industry. Wood characterization is the most

  important activity for better use of this material,

  contributing for increasing its performance. New

  technologies on wood characterization are the

  focus of researches carried out lately. X-ray

  Diffraction (XRD) is a very useful technique for

  microstructure characterization of wood. This

  paper aims to investigate the measurement

  beam direction (Parallel and Perpendicular to

  grain) influence on Pinus wood Crystallinity,

  and estimate this parameter based on the

  Segal crystallinity. According to results, there

  is no significative difference between wood

  crystallinity in the different measurement

  directions considered, and linear regression

  model performed for Crystallinity estimation

  by Segal crystallinity presented coefficient of

  determination equal to 0.9621.

• Número de páginas: 15